Key Features
- Plating thickness measurement: General, Rh, Pd, Au, Ag, Sn, Ni
- Film thickness measurement of multilayer thin films (up to 5 layers)
- Energy Resolution of SDD: 125eV FWHM at Mn Kα
- Optional: Energy Resolution of Fast SDD: 120eV FWHM at Mn Kα
- Multi collimator (options: 0.05, 0.1, 0.2, 0.3, 1mm)
- Auto stage mode
- Optional RoHS screening
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